RECRYSTALLIZATION OF COLD DEFORMED TUNGSTEN

Abstract

An investigation of the recrystallization of cold deformed W is described. Electronic microphotographs were made of undeformed and deformed test specimens. Hardness tests were made on deformed specimens subjected to various vacuum annealing temperatures from 800 to 1650 degrees. X-ray diffraction studies were made on undeformed, deformed, and annealed test pieces; the relation of the broadening of the spectral line (321) to the annealing temperature was established.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1960
Accession Number
AD0257150

Entities

People

  • I. Ye. Shiyanovskaya
  • V. A. Lavrenko

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Annealing
  • Diffraction
  • Distortion
  • Government Procurement
  • Governments
  • Hardening
  • Hardness
  • Mechanical Properties
  • Modulus Of Elasticity
  • Recrystallization
  • Spectral Lines
  • Technical Information Centers
  • Tungsten
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics