STUDY OF THE MAGNETIZATION OF THIN, EVAPORATED NICKEL FILMS IN A CHANGING ENVIRONMENT
Abstract
The magnetization of Ni films in the thickness range from a few to several hundred angstroms was investigated first under ultrahigh vacuum conditions and then after exposure to an O or H atmosphere at various pressures. Oxidation of the films to a depth of 10 to 15 angstroms takes place in a short time even at pressures of oxygen in the 10 to the -8th power mm range. Exposure to H of initially clean films resulted only in reversible changes of the transverseANISOTROPY CONSTANT. Unusually large increases in the transverse anisotropy of Ni films result when one changes a Ni-vacuum interface to a Ni-Cu interface. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1961
- Accession Number
- AD0258376
Entities
People
- C.a. Neugebauer
Organizations
- General Electric