STRUCTURE OF DEFECT CLUSTERS IN SOLIDS
Abstract
Preliminary results have been achieved on a small angle scattering study of defect clustering in irradiated single crystals. Silicon single crystals irradiated to a total of 2 x 10 to the 19th power nvt fast neutron flux fail to show any small angle scattering. Some small angle x-ray scattering was detected from a lightly irradiated sample of LiF, but preliminary results from a lithium-doped silicon single crystal are negative, even though it was thought to contain 100 A clusters of pure lithium metal. Such clusters should be detectable using small angle x-ray diffraction; no conclusive reasons are apparent why this sample did not show small angle scattering. Scattering intensity calculations are treated in an appendix. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 12, 1961
- Accession Number
- AD0258384
Entities
People
- John W. Buttrey
Organizations
- IIT Research Institute