DEVELOPMENT OF TRANSISTORIZED AND MODERNIZED INTERFERENCE MEASURING SET AN/PRM-1 (XN-2)
Abstract
A detailed description is presented of a transistorized interference measuring set AN/PRM-1(XN-2). Completely redesigned transistorized circuits were developed for the RF, IF, detector and voltmeter amplifier systems. Evaluation tests were performed and the general and factual data resulting from these tests are described. Also included are studies and comments upon the various aspects of the transistorized circuitry. Recommendations are given for improvement in the existing transistorized circuitry based upon the experience gained in the test performance. Specific requirements for construction of prototype models are given. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 08, 1960
- Accession Number
- AD0258396