ELECTRON MOBILITY IN CADMIUM SULPHIDE SINGLE CRYSTALS AT LOW TEMPERATURES

Abstract

The dependence of electron mobility on temperature for charge carriers in single crystals of CdS was investigated between 4.2 and 273 K. The mobility, mu, was obtained by determining the value of the Hall constant and the crystal resistivity. The crystals were shaped into parallelpipeds and prepared for electrical measurements by applying indium contacts on their surfaces by ultrasonic techniques. Electrical measurements were conducted in a liquid helium cryostat. The mobility, the Hall constant, the resistivity, and the charge carrier density were plotted as a function of 1/T. The mobility increased rapidly from 273 K to a maximum near 25 K and then decreased sharply near 4.2 K. Analysis of the data indicated that the experimental behavior of the mobility of charge carriers at low temperatures can be explained in terms of impurity band conduction.

Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1961
Accession Number
AD0259661

Entities

People

  • Louis Joseph Del Do

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Charge Carriers
  • Crystals
  • Electrical Measurement
  • Electron Mobility
  • Electrons
  • Low Temperature
  • Measurement
  • Mobility
  • Single Crystals

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics