TRANSIENT RADIATION EFFECTS ON ELECTRONICS. PART 1. KUKLA TRANSIENT RADIATION TESTS

Abstract

Contents: Kukla dosimetry Transient effects in dielectrics and capacitors Transient radiation induced spark gap breakdown in air Transient radiation induced firing of 5643 thyratron Transient effects in semiconductor diodes Analysis of circuit and piece part test requirements for transient radiation effects testing The kukla prompt critical facility.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1961
Accession Number
AD0261933

Entities

People

  • Richard L. Lander
  • Robin K. Durkee

Organizations

  • Boeing

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Artificial Satellites
  • Circuit Analysis
  • Dielectrics
  • Electron Tubes
  • First Order Circuits
  • Gamma Rays
  • Materials Laboratories
  • Materials Testing
  • Measurement
  • Nuclear Radiation
  • Radiation Effects
  • Semiconductor Devices
  • Semiconductor Diodes
  • Semiconductors
  • Test Equipment
  • Transducers

Fields of Study

  • Engineering
  • Physics

Readers

  • Electronics Engineering
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems