70 MC, 1 WATT SILICON TRANSISTOR

Abstract

Storage life test of 200 C for the pre-production samples was completed. The complete pre-production test results show three thermal resistance and two vibration fatigue failures. Aindicate that the present device process will produce transistors meeting the specified requirements. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 05, 1961
Accession Number
AD0262345

Entities

People

  • F.l. Katnack

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Life Tests
  • Production
  • Resistance
  • Thermal Resistance
  • Transistors
  • Vibration

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Electrical Engineering
  • Structural Health Monitoring of Composite Structures.