A STUDY OF SEMICONDUCTOR RELIABILITY

Abstract

A study was undertaken to determine the mechanics of failure of semiconductor devices. A review is given of the physical and statistical basis for failures and failure testing. A review is also presented of the present status of transistor reliability. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1961
Accession Number
AD0263625

Entities

People

  • B.a. Bowen

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Electronic Equipment
  • Electronics
  • Mechanics
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Transistors

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics