A STUDY OF FILMS IN ELECTRON TUBES
Abstract
Results are presented of the analysis of thin films by neutron activation techniques along with a special procedure developed to determine short lived elements. Some data from analyses by reflection electron diffraction are also presented. Additional calibration work has been conducted on the twin crystal oscillator thin film monitor to determine the mode of change of resonant frequency of the crystal as a function of film surface density. A new sublimation unit is described which should permit the simultaneous study of certain film properties, such as resistance versus mass. The work accomplished, the design, processing schedule, and parts analysis flow chart of the Random Balance Experiment are given. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1961
- Accession Number
- AD0263812
Entities
People
- J.w. Ii. Hall
Organizations
- General Electric