STUDY OF SHORT TERM STABILITY OF CRYSTAL OSCILLATORS
Abstract
Research was concerned with the factors underlying the short term stability of crystal oscillators. A discussion is presented of a technique for measuring the frequency of a source in a short time interval. Design criteria are presented and sources of error are analyzed. A set of curves useful in the design of the measuring system is given. An analysis is also given of the effects of noise on the frequency of a source. Models based on the work of S. O. Rice and J. S. Bendat are discussed and some typical results calculated. Contained in the report is an extensive bibliography on: (1) frequency measurements, (2) frequency multipliers and dividers, (3) frequency standards and oscillators, (4) short time frequency stability, (5) piezoelectric parameters, (6) signal analysis, and (7) instantaneous frequency. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1961
- Accession Number
- AD0263937
Entities
People
- Gerald Weiss
- James Rarity
- Lester Saporta
Organizations
- New York University