THE MEASUREMENT OF ARBITRARY LINEAR MICROWAVE TWO-PORTS
Abstract
The measurement of the scattering parameters of linear, but otherwise arbitrary, two-port 9active, lossless or dissipative and reciprocal or non-reciprocal) by means of an interference bridge is described. Since the measured data form circular loci from which the parameters are then derived, known precision curve fitting technique are applicable. The various loci which may occur and their characteristics are discussed together with the methods available for dis tinguishing the proper locus from its inverse. Various methods of balancing the bridge and many of the errors associated with bridge balancing are given. Finally, the deliberate use of bridge imbalance for increasing measurement accuracy is considered. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 27, 1961
- Accession Number
- AD0264042
Entities
People
- Helmut M. Altschuler
Organizations
- New York University Tandon School of Engineering