NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH
Abstract
The low-frequency parametric amplifier was completed and tested. The performance is compared with the results of a theoretical analysis. The noise performance obtained showed some 1/f noise at low frequencies. Preliminary measurements were begun on the photoelectric noise in the image section of an image orthicon. With a light source consisting of a gas-filled tungsten bulb, the initial spectrum showed a 1/f dependence at low frequencies. This is not attributed to the photoemission process but probably comes from the light source. Measurements of Seebeck noise and the mo-emf of bulk oxide materials were continued. Measurements of the noise of 6J6 decalcoated cathodes showed a large amount of 1/f noise. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1961
- Accession Number
- AD0264347
Entities
People
- A. Van Der Ziel
Organizations
- University of Minnesota