MEASUREMENTS OF SHOT NOISE IN TUNNEL DIODES AT LOW FORWARD VOLTAGES

Abstract

An accurate method for experimentally determining the equivalent shunt noise-current generator in tunnel diodes in the low positive-resistance regions is described. Using this method, shot-noise measurements were made on a type 1N2939 tunnel diode in the bias range from zero voltage to the peak point, and athree temperatures (203K, 300K, and 373K). The results are presented and compared with calculated noise values. Excellent agreement obtained suggests that the existing theory of shot-noise in tunnel diodes in the low-bias region is adequate.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1961
Accession Number
AD0264348

Entities

People

  • Carl N. Berglund

Organizations

  • Massachusetts Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Direct Current
  • Electrical Engineering
  • Engineering
  • Frequency
  • Frequency Bands
  • Generators
  • Government Procurement
  • Governments
  • Low Noise
  • Low Noise Amplifiers
  • Measurement
  • Noise Generators
  • Shot Noise
  • Signal Generators
  • Standards
  • Tunnel Diodes

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Statistical inference.