STUDIES, RESEARCH AND INVESTIGATIONS OF THE OPTICAL PROPERTIES OF THIN FILMS OF METALS SEMI-CONDUCTORS AND DIELECTRICS
Abstract
The optical constants of cuprous oxide films 590 and 200 Angstroms thich were determined. For the 590 Angstrom film this was done for wavelengths from 1 micron to 5882 Angstroms. The exact thickness of the 200 Angstrom film was determined by selecting the thickness value that yielded the same optical constants at several points as did the thicker film. Using this thickness value, the optical constants were determined for wavelengths from 7700 to 4000 Angstroms. The absorption spectra of several thick Cu2O) films at liquid nitrogen temperature was observed. Films on glass, NaCl and KBr were observed. The thicker samples were estimated to be several thousand angstroms thick. In no case was a fine structure corresponding to exciton absorption observed. While each of the films appeared ruby red in transmission as did the very thick Cu2O samples prepared by Misho (1:24), they did not have a sharp absorption edge as did Misho's samples. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 12, 1961
- Accession Number
- AD0265063
Entities
Organizations
- Colorado State University