STUDIES, RESEARCH AND INVESTIGATIONS OF THE OPTICAL PROPERTIES OF THIN FILMS OF METALS SEMI-CONDUCTORS AND DIELECTRICS

Abstract

A bibliographic review of 166 references covering the years 1944 through 1961 on the use of X ray radiography for attaining quality assurance in industrial manufacture of electronic components is presented. An author index and a combined periodical and source index is included. (LS-PL).

Document Details

Document Type
Technical Report
Publication Date
Jun 15, 1960
Accession Number
AD0265065

Entities

Organizations

  • Colorado State University

Tags

DTIC Thesaurus Topics

  • Coverings
  • Dielectrics
  • Electronic Components
  • Films
  • Materials
  • Optical Properties
  • Periodicals
  • Radiography
  • Thin Films
  • X Rays

Fields of Study

  • Physics

Readers

  • Library and Information Science/ Studies, Southeast Asia Studies, Bibliography of Vietnam and Lao Studies.
  • Materials Science and Engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene