STUDIES OF GRAIN-BOUNDARY DIFFUSION BY ELECTRON-PROBE MICROANALYSIS

Abstract

The diffusion of Ni into grain boundaries of various tilt angles in copper bicrystals was studied. Concentration contours from the grain boundary and the lateral-lattice diffusion were measured by means of electron-probe microanalysis. The products of grain-boundary width and diffusion coefficient were calculated and comparisons were made with theoretical solutions. The grain-boundary co fficient is concentration dependent above 3% Ni in a 45-degree tilt boundary. With lower tilt angles, the coefficient is concentration dependent above 0.5% Ni. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1961
Accession Number
AD0265616

Entities

People

  • A.e. Austin
  • C.m. Schwartz
  • N.a. Richard

Organizations

  • Battelle Memorial Institute

Tags

DTIC Thesaurus Topics

  • Boundaries
  • Coefficients
  • Diffusion
  • Diffusion Coefficient
  • Electron Probes
  • Electrons
  • Grain Boundaries
  • Microanalysis
  • Probes

Readers

  • Analytical Chemistry
  • Materials Science and Engineering.
  • Regression Analysis.

Technology Areas

  • Microelectronics