ANODIC FORMATION OF TITANIUM OXIDE DIELECTRIC FILMS

Abstract

An instrument was designed to measure the capacitance and dielectric loss of an anodic film during its formation. Results obtained on Ti are discussed. The instrument was designed to control the automatic production of capacitors; however, it has since become more useful as a tool in studying formation of anodic oxide films. The capacitance and loss of the oxide film are measured using the anode as one electrode and the electrolyte as the other. In this system, the capacity is inversely proportional to the dielectric film thickness. An indication of film quality is obtained at the same time by measuring loss tangent during the forming process. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1961
Accession Number
AD0266358

Entities

People

  • R.t. Lamoureux

Organizations

  • Lockheed Martin Missiles and Space

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Automatic
  • Capacitance
  • Capacitors
  • Dielectric Films
  • Electrodes
  • Electrolytes
  • Films
  • Oxide Films
  • Oxides
  • Production
  • Thickness
  • Titanium
  • Titanium Oxides

Readers

  • Aviation Science / Aeronautics.
  • Electrochemical Engineering/ Fuel Cell Technologies
  • Materials Science and Engineering.