PRIMARY PATTERN MEASURE OF A LINE SOURCE FEED FOR A SPHERICAL REFLECTOR

Abstract

IN DESIGNING A LINE SOURCE FEED FOR A SPHERICAL REFLECTOR, IT IS CUSTOMARY TO DETERMINE THE FIELD DISTRIBUTION ACROSS THE APERTURE BY MEASURING THE PRIMARY PATTERN (amplitude and phase of the field on the surface of the reflector) of the line source. This measurement becomes extremely difficult when the reflector is large since either a precision circular track or a long rigid beam is required. Using geometric optics it is shown that the amplitude and phase at the aperture can be determined from the amplitude and phase measured when the line source is rotated about its paraxial focus. Since all that is required to make the measurement is a turntable and a stationary pickup probe, the experimental setup is considerably simplified. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1961
Accession Number
AD0267014

Entities

People

  • Edward E. Altshuler

Organizations

  • Air Force Cambridge Research Laboratories

Tags

DTIC Thesaurus Topics

  • Amplitude
  • Measurement
  • Precision
  • Reflectors
  • Stationary
  • Turntables

Fields of Study

  • Physics

Readers

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