ANALYSIS OF REFRACTORY METALS USING A NEW SOLID SOURCE DOUBLE FOCUSING MASS SPECTROMETER.
Abstract
A newly developed solid sample-spark source mass spectrometer capable of sensitivities of 0.1 to 0.01 ppm is briefly described. Analytical techniques, methods, and results are presented for the analysis refractory metals. Emphasis is placed on tract element analysis of high purity single crystal and polycrystalline W and comparisons are made concerning methods of purification. Data are also shown for analysis of W in which a dispersed second phase such as ThO2 exists. Analysis of other components purposely introduced to W to increase yield and creep rupture strength is discussed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1961
- Accession Number
- AD0268232
Entities
People
- David W. Fischer
- William L. Baun