HIGH RESOLUTION CONTACT X-RAY MICROSCOPY
Abstract
EXPERIMENTS ON HIGH RESOLUTION X-RAY RECORDING MATERIALS HAVE SHOWN THAT A GREAT MANY POSSIBILITIES EXIST FOR PRODUCING CONTACT X-RAY IMAGES WHICH CAN BE ENLARGED WITH THE ELECTRON MICROSCOPE. Soft x-ray resolution of about 500 angstroms showed that exposure times for such images may be of the order of 10 minutes. The useful field of view may be of the order of 1000 times the minimum resolving distance. The experimental techniques have not yet been reduced to routine practice since almost all the work has been exploratory in nature serving only to demonstrate the possibilities of the general method. Although special instruments such as the microfluoroscope were used in much of the irradiation, it was also demonstrated that a slight modification of the electron microscope which is used to enlarge the x-ray images will also permit its use for the primary irradiation. Throughout the work an attempt was made to use only those specimen preparation and mounting techniques which are consistent with standard electron microscope procedures. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1961
- Accession Number
- AD0269742
Entities
People
- Howard H. Pattee
Organizations
- Stanford University