ETCHING OF HIGH PURITY ZINC
Abstract
An etching technique for revealing dislocations in high purity Zn single crystals without the addition of solute impurities was developed. The technique involves surface doping prior to chemical polishing. Evidence for a one to one correspondence between etch figures and dislocations is presented, together with some preliminary observations of slip on (0001) basal and (1212) pyramidal planes and twinning in Zn. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1961
- Accession Number
- AD0271586
Entities
People
- K.h. Adams
- R.c. Brandt
- T. Jr. Vreeland
Organizations
- California Institute of Technology