MICROANALYSIS WITH ULTRASOFT X-RADIATIONS

Abstract

The diffraction, reflection, absorption, fluorescence and the electronic emission which results from the interaction with ultrasoft x-rays are presented as practical bases for microanalysis. Recent developments on sources and detectors for the ultrasoft x-radiations are described. A preliminary report of a current investigation on low energy photo-Auger electron analysis and on a new type of low energy electron spectrometer is also presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1962
Accession Number
AD0272771

Entities

People

  • Burton L. Henke

Organizations

  • Pomona College

Tags

DTIC Thesaurus Topics

  • Absorption
  • Auger Electrons
  • Beta Particles
  • Corpuscular Radiation
  • Detectors
  • Diffraction
  • Electromagnetic Wave Detectors
  • Electrons
  • Elementary Fermions
  • Elementary Particles
  • Emission
  • Fermions
  • Ionizing Radiation
  • Microanalysis
  • Nuclear Radiation
  • Radiation
  • X Rays

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics