STUDY OF RADAR ABSORBER MATERIALS
Abstract
A microwave interferometer apparatus was used for precision measuring of insertion loss and insertion phase in X-band. Calculations for conversion of the insertion loss and phase data to dielectric constant and loss tangent were made for 1/4-, 3/8-, and 1/2-in.-thick samples of lossy dielectric materials. A typical graph for conversion of the computed data on 3/8-in.-thick samples up to dielectric constant of 5.0 is included as an initial correlation of the interferometer results with those obtained on a microwave dielectrometer is given. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 31, 1962
- Accession Number
- AD0275425