CHARACTERISTIC MODIFIED X-RAY SCATTERING

Abstract

The spectroscopic anlysis of the scattered x-rays from lithium, lithium oxide, lithium fluoride, beryllium and boron irradiated by copper target radiation esablishes the existence of sharp characteristic modified lines on the longer wavelength side of the primary beam. This is a new type of incoherent x-ray scattering. The K term values of lthium, beryllium and boron and the L1 term value of fluorine in lithium fluoride have been calculated from the observed modified lines and these are 58.1, 113.6, 199.0 and 40.6 electron volts respectively. Taking into account the limits of error in these experiments the term values obtained by this new method agree well with the values obtained by Skinner by the method of soft x-ray spectroscopy. Evidence obtained until now about the angular dependence of intensity of the newly observed modified ines rings up several interesting points helping to understand the prticular process of scattering and these poins have been discussed. (AUTHO)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1962
Accession Number
AD0275883

Entities

People

  • K. Das Gupta

Organizations

  • California Institute of Technology

Tags

DTIC Thesaurus Topics

  • Beryllium
  • Fluorides
  • Fluorine
  • Ionizing Radiation
  • Optical Materials
  • Radiation
  • Scattering
  • Soft X Rays
  • Spectroscopy
  • X Ray Scattering
  • X Ray Spectroscopy
  • X Rays

Fields of Study

  • Physics

Readers

  • Calculus or Mathematical Analysis
  • Solar Physics
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene