PREDICTION OF CIRCUIT DRIFT MALFUNCTIONS OF SATELLITE SYSTEMS
Abstract
Conventional methods for achieving low probability of drift malfunctions in electronic circuits, such as worst-case design, do not provide any measure of the expected circuit degradation during operating life. Statistical analysis techniques are available which permit analytical prediction of probable circuit performance; however, these techniques have not achieved wide acceptance, perhaps due to the lack of sufficient evidence which would indicate technique feasibility and accuracy. Three statistical analysis methods were applied to predict various performance characteristics of six typical circuits which are used in transistor electronics. The results were then compared with the measured performance after approximately 2000 hrs. of circuit test operation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1962
- Accession Number
- AD0276044
Entities
Organizations
- International Business Machines Corporation (Armonk, NY)