RESEARCH ON ELECTRON BOMBARDMENT INDUCED CONDUCTIVITY TARGETS IN CAMERA TUBES

Abstract

An analysis of scan parameters as they affect the performance of electron bombardment induced conductivity (EBIC) targets is presented. The conclusion is reached that the secondary emission characteristic of the target surface is an extremely important parameter in camera tubes of the photoconductivity and EBIC types. Evidence that the electron absorptivity of the target for low voltage electrons is affected by the degree of induced excitation is presented. Results of an investigation of different EBIC target materials are reviewed. The fabrication of experimental EBIC tubes having electrostatic and magn tic focused image sections is described. Test results are discussed.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1962
Accession Number
AD0277642

Entities

People

  • G. Klotzbaugh
  • J. Lempert

Organizations

  • Westinghouse Electric Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Band Gaps
  • Camera Tubes
  • Charge Carriers
  • Conductivity
  • Dielectrics
  • Electron Emission
  • Electrons
  • Emission
  • Energy Bands
  • Equations
  • Fabrication
  • Materials
  • Measurement
  • Secondary Emission
  • Solid State Physics
  • Space Charge

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics