STUDY OF FAILURE MECHANISMS AT SURFACES AND INTERFACES
Abstract
The investigation of the primary modes of failure in solid state devices and components is directed toward the study of chemical and physical phenomena occurring at the interfaces formed by two dissimilar materials in intimate molecular contact. The experimental approach is based on the concept of building and evaluating thin-film model systems representing two basic material interfaces found in solid state device technology: interface between an electrode and thin film glass dielectric, and interface between a solid state semiconductor resistance element and its substrate. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 27, 1962
- Accession Number
- AD0277728
Entities
People
- Kenneth Greenough
Organizations
- Motorola Mobility