SERIES AND PARALLEL ARRANGEMENTS OF ELECTRICALLY INITIATED EXPLOSIVES

Abstract

THE OVER-ALL ELECTRICAL RELIABILITY OF ANY SYSTEM IN WHICH COMPONENT INPUTS ARE INTER-CONNECTED CAN BE DERIVED FROM A MODIFIED FORM OF THE BINOMIAL PROBABILITY THEOREM USING THE FUNCTIONAL RELATIONSHIP OF THE OUTPUTS TO DETERMINE THE RELEVANT GROUP PROBABILITY. IN APPLYING THIS THEORY TO WIRE BRIDGE FUZES (SQUIBS) IT IS FOUND THAT IF SHORT-CIRCUIT INPUT DEFECTS ARE EQUALLY LIKELY, A SERIES INPUT ARRANGEMENT IS MORE RELIABLE ELECTRICALLY, THAN IS A PARALLEL ARRANGEMENT,WHICH IS PERHAPS CONTRARY TO COMMON BELIEF. WHEN THE ELECTRICALDEFECT PROBABILITIES ARE VERY SMALL A SERIES ARRANGEMENT IS MORE OR LESS RELIABLE THAN A PARALLEL ARRANGEMENT ACCORDING AS THE PROBABILITY OF A SHORT-CIRCUIT IS GREATER OR LESS THAN THAT OF AN OPEN-CIRCUIT

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1962
Accession Number
AD0278832

Entities

People

  • R.i. Gray

Organizations

  • Naval Surface Warfare Center Dahlgren Division

Tags

DTIC Thesaurus Topics

  • Binomials
  • Circuits
  • Explosives
  • Mathematics
  • Probability
  • Reliability
  • Short Circuits

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Regression Analysis.