STUDY OF FIELD EMISSION FROM SEMICONDUCTORS; FIELD EMISSION APPLICATIONS; ELECTRON GUNS FOR FIELD EMISSION BEAMS

Abstract

The study of field emission from semiconductor materials is reported in some detail. Items covered include: Fabrication of field emission tips, operation of tips in a field emission projection microscope, interpretation of field emission patterns, migration processes, doping of tip material, tip geometry, tip temperature, and operation in a boron-free environment. Field emission applications are reported. A study of the electrostatic focusing of high current density field emission beam is described.

Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1960
Accession Number
AD0282367

Entities

People

  • C.h. Hinrichs
  • F.m. Charbonnier
  • R.l. Perry

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Current Density
  • Electron Guns
  • Electronics
  • Electrons
  • Emission
  • Environment
  • Fabrication
  • Field Emission
  • Geometry
  • Materials
  • Microscopes
  • Migration
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Physics

Readers

  • Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics