AUTOMATIC TESTING SYSTEM
Abstract
A system for the automatic testing of electronic devices has been designed. It is applicable to the measurement of test parameters that are available as dc voltages or can be converted to dc voltage prior to injection into the system. It memorizes n parameters simultaneously and then records them sequentially on IBM cards or tape. (A prototype for 10 parameters has been constructed.) Voltage comparators indicate the relation of the test data being recorded to specification requirements by lighting of the appropriate lamp to show go, high, or low. As a universal-type testing device for both R+D and production it offers significant advantages with respect to accuracy, reliability, costs, and efficient utilization of test personnel. The system, with the exception of the specially built memory circuitry, can be assembled from commercially available equipment. Operation has been checked out against static sources such as battery-operated voltage dividers and active sources such as guided missile fuzes with satisfactory results. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 25, 1962
- Accession Number
- AD0282525
Entities
People
- Morris Brenner
Organizations
- Harry Diamond Laboratories