SPECTRAL AND TOTAL EMISSIVITY APPARATUS AND MEASUREMENTS OF OPAQUE SOLIDS
Abstract
Three methods of measuring the normal spectral, total normal and total hemispherical emissivity of opaque solid materials are described. Spectral emissivity measurements are performed at approximately ambient temperature and encompass the wavelength interval .4 to 25 microns. Total hemispherical emissivity measurements cover the temperature range 0 C to 600 C. Results of the emissivity measurements, of various materials, as performed with each of the systems, are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 10, 1959
- Accession Number
- AD0282600
Entities
People
- Clyde C. Shaw
- James C. Berry
- Thomas W. Lee
Organizations
- Lockheed Martin Missiles and Space