MOLECULAR CIRCUIT DEVELOPMENT
Abstract
This report includes: Fullam, Ernest F., Inc., Schenectady, N. Y. ELECTRON DIFFRACTION ANALYSIS OF EVAPORATED FILMS. 9 July 62. Research continued on thin-film circuits and systems in which electronic circuit elements are integrated in a material matrix to a point where individual elemental appearances have been lost. The circuits will be capable of operating at 500 C., and should possess a high degree of radiation resistance. The circuits, as conceived, will contain microareas within a single film and/or be formed of layers of metals, semiconductors, and dielectrics in preconceived conceived configurations to provide the necessary electronic functions. The objective is to be accomplished by performing studies of film and microcrystal formation, surface and interfacial phenomena, and geometric studies of configurations to use, to the maximum advantage, the physical effects that occur in thin films. The electronic circuits so formed will possess a maximum degree of microminiaturization. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 15, 1962
- Accession Number
- AD0282722
Entities
People
- Wilbur T. Layton
Organizations
- Melpar