TEMPERATURE DEPENDENCE OF LINE STRUCTURE OF CADMIUM SULFIDE EDGE EMISSION

Abstract

The temperature dependence of the line structure in Cds edge emission stimulated by UV light was investigated from 4.2 K to 367 K. The spectral shift of the fine structure observed at 4.2 K was followed to 77 K where the individual lines broadened and merged into groups. The temperature dependence of the primary line groups is a linear function of temperature above 220 K with coefficients of change of 1.27 and 1.8 Angstroms degree K for the lines observed. Below 220 K the dependence departs from linearity and approaches its limiting value more rapidly with decreasing temperature. Striations, due to variations of the luminescent properties over the surface of the crystal, were observed in emission spectra. These striations were used to advantage in the resolution of the various broad overlapping bands found in the emission spectrum at higher temperature. Two individual bands were resolved in the room temperature spectrum with peaks at 5090 and 5275 Angstroms. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1962
Accession Number
AD0284015

Entities

People

  • William Alison Anders

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Chemical Compounds
  • Coefficients
  • Compound Semiconductors
  • Electronics
  • Emission
  • Emission Spectra
  • Linearity
  • Semiconductors
  • Solid State Electronics
  • Spectra
  • Striations

Readers

  • Materials Science and Engineering.
  • Spectroscopy.