INDUSTRIAL PREPAREDNESS STUDY ON DEVICES 13, 14, 15 EXTENDED LIFE TEST 5000 HOUR DATA REPORT,

Abstract

Presented is the status of the extended life test program involving transistor types 2N1484, 2N1480 and 2N1488 at the 5000 hour interval. The effects of storage at various temperatures and power dissipation levels of power transistors out to 5000 hours are included. Static operating circuits used in this program are shown. All data to 5000 hours is shown in graphical form. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1962
Accession Number
AD0284175

Entities

People

  • John Wright

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Dissipation
  • Industrial Preparedness
  • Intervals
  • Life Tests
  • Transistors

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Integrated Circuit Design and Technology.
  • Software Engineering