NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH

Abstract

Work on noise in image orthicons was completed. The current leaving the photocathode shows full shot noise. The readout beam shows full shot noise for the frequency r gion of interest. The oise in the first dynode is larger than would be anticipated from a Poisson distribution of the electron emission. Low-noise amplifiers were developed that have 25-50 ohms equivalent noise resistance at the input of the first stage. Additional data was obtained on the noise in Al-Al2O3-Al sandwiches. The results agree with earlier observations. The noise measurements on indium-doped CdS crystals were extended o different samples. Additional measurements have been performed on noise in the light emission of MgO cold cathodes. Noise in the electron emission has been determined. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 30, 1962
Accession Number
AD0284693

Entities

People

  • A. Van Der Ziel

Organizations

  • University of Minnesota

Tags

DTIC Thesaurus Topics

  • Amplifiers
  • Electron Emission
  • Electrons
  • Emission
  • Image Orthicons
  • Low Noise
  • Low Noise Amplifiers
  • Measurement
  • Noise
  • Photocathodes
  • Photoexcitation
  • Shot Noise

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics