NF RESISTOR FACTORIAL LOAD LIFE TEST

Abstract

Preparation of a test design was continued for the purpose of performing a factorial load life test on hermetically sealed glass NF resistors. Failure rate data and acceleration factor data are to be obtained on 22,000 hermetically sealed tin-oxide resistors subjected to temperatures of 75, 100 and 125 C and power dissipating levels of up to 4 times their normal rated power for 2000 hrs. Some 450 resistors are to be tested at 70 C for 10,000 hrs at their rated power. Test equipment includes an automatic data handling system, a card punching machine and a digital computer.

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1962
Accession Number
AD0285143

Entities

People

  • W.c. Beck

Organizations

  • Corning Inc.

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Automatic
  • Computers
  • Digital Computers
  • Life Tests
  • Machines
  • Punching Machines
  • Resistors
  • Test Equipment

Readers

  • Computer Science.
  • Electronics Engineering
  • Thermal Physics or Thermal Science.