A METHOD FOR DETERMINATION OF THE OPTICAL CONSTANTS OF THIN ABSORBING LAYERS

Abstract

Tables are presented which enable the optical constants of a thin absorbing layer on an absorbing base to be determined from measurements of the light reflected by this system. The mthod was applied to layers of 'nickel-black' on silver substrates.

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1962
Accession Number
AD0285463

Entities

People

  • H. Weinberger
  • J. R. Harris

Organizations

  • Air Force Cambridge Research Laboratories

Tags

DTIC Thesaurus Topics

  • Measurement

Fields of Study

  • Physics

Readers

  • Spectroscopy.
  • Systems Analysis and Design
  • Thin Film Deposition Science.