STUDY OF SHORT TERM STABILITY OF CRYSTAL OSCILLATORS
Abstract
A study is described of the effects of noise on the r.m.s. frequency deviation of an oscillator. Several models are assumed. In one case the noise and signal are linearly added and the assumption is made that the noise does not enter the feedback loop o the oscillator. It is shown that this predicts an inverse first power variation of the r.m.s. frequency deviation with respect to the integration time inherent in the frequency measurement. In other models, the noise is included in the feedback loop and results in an inverse one-half power variation. Evidence is adduced to indicate that both effects take place in practical oscillators and some estimates of the magnitude of these effects are made. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1962
- Accession Number
- AD0286305
Entities
People
- G. Weiss
- L. Saporta
Organizations
- New York University