RELIABILITY STUDY HIGH RATE LECLANCHE WAFER CELLS
Abstract
Each lot of wafer batteries was stored for various temperatures and times as enumerated below and then tested: 70 F - 3 and 1 yr, 113 F - 3 mo, 6 mo; 130 F - 3 mo, 160 F - 1 mo. In addition, all lots made with a low temperature electrolyte were tested at 0 and -20 F. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1962
- Accession Number
- AD0286972
Entities
People
- Martin Sulkes