Research and Development Program Intrinsic Reliability Subminiature Ceramic Capacitors.

Abstract

A discussion is presented on the intrinsic reliablity program for subminiature ceramic capacitors. Investigations for the attainment of high reliability in subminiature ceramic capacitors and the determination of falure rate as a function of voltage and temperature are presented as test data. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 31, 1962
Accession Number
AD0287600

Entities

People

  • F.b. Schoenfeld
  • J.h.d. Folster
  • T.i. Prokopowicz

Organizations

  • Sprague Electric

Tags

DTIC Thesaurus Topics

  • Capacitors
  • Ceramic Capacitors
  • Electronic Components
  • High Reliability
  • Reliability

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Systems Analysis and Design