SEMICONDUCTOR DEVICE CONCEPTS
Abstract
Double injection diodes are described which, depending upon the kind of deep level doping impurities empolyed, exhibit instabilities and coherent and/or noisy oscillations in normally positive resistance regions of the v-i characteristics. Similar oscillations in n-type bars of Silicon compensated with certain deep level impurities are also described. The influence of deep levels on these phenomena is discussed. Some preliminary results on experiments with (As sub x P sub 1-x) light emitting junctions are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 31, 1962
- Accession Number
- AD0289374
Entities
Organizations
- General Electric