HIGH VOLTAGE SILICON RECTIFIER STACKS

Abstract

Design testing of the third engineering samples was started. The first unit of the fourth engineering samples was built having an internal expansion chamber, corona endshields and a lesser number of higher voltage rectifier diodes. Thermal measurements confirmed closely the original calculations of temperature rise for the rectifier stack. The reduction in the number of rectifier diodes in the fourth engineering samples reduces the temperature rise appreciably. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1962
Accession Number
AD0289378

Entities

People

  • Werner Luft

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Diodes
  • Electronic Equipment
  • Engineering
  • High Voltage
  • Measurement
  • Rectifiers
  • Voltage

Readers

  • Electrical Engineering
  • Mathematics or Statistics
  • Thermal Physics or Thermal Science.