THE MECHANISM OF OXIDE FORMATION IN THE INITIAL STAGES OF OXIDATION

Abstract

Work comprised field emission experiments in which O at pressures between 10 to the -10th and 10 to the -4th power mm Hg was reacted with clean W and Ta substrates at temperatures between 25 and 2000C. The random nucleation of a distinct second phase was observed on tantalum at 830 and 1135C. Marked differences between the course of reaction of O on W and of O on Ta are becoming apparent. Considerable difficulty was encountered in developing a reproducible technique for the cleaning of Ta emitter-substrates. The most recent method developed, however, did produce a clean tantalum emission pattern very readily without the use of field evaporation. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 14, 1962
Accession Number
AD0290258

Entities

People

  • D.w. Rausch
  • K.l. Moazed
  • M.g. Fontana

Organizations

  • Ohio State University

Tags

DTIC Thesaurus Topics

  • Chemical Compounds
  • Critical Temperature
  • Electron Emission
  • Emission
  • Emitters
  • Evaporation
  • Field Emission
  • Glass Transition Temperature
  • Nucleation
  • Ores
  • Oxidation
  • Oxides
  • Substrates
  • Tantalum
  • Transition Temperature

Readers

  • Theoretical Analysis.
  • Thin Film Deposition Science.