STUDY OF FAILURE RATE DISTRIBUTIONS OF SERIES-PARALLEL CONFIGURATIONS.
Abstract
The primary purpose of this project is to conduct an investigation of a technique for predicting the reliability of electronic circuits, the component parameters of which are effectively in series-parallel configurations. The reliability prediction will be based on the distributions of the component part parameters and a mathematical equation which relates the circuit attributes to the component part parameters. A method for empirically developing the mathematical relationship is an integral part of this investigation. Compilation of a selected bibliography and the initial steps in the empirical model building phase have been taken; this includes tentative component selection. This report covers the first quarter of a one-year program. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 30, 1962
- Accession Number
- AD0290324
Entities
People
- A. C. Nelson
- J. B. Tommerdahl
Organizations
- RTI International