Combined Environmental Testing of Semiconductor Devices.

Abstract

The object of this study is to ascertain whether the combined environmental effects of temperature and pulsed nuclear (gamma and neutron) radiation on semiconductor devices are simply the sum of the two single effects or a complex interaction of the two, and, to develop a theoretical explanation of the observed phenomena

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1962
Accession Number
AD0291047

Entities

People

  • Alton L. Long

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Electronics
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Radiation
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Solar Physics
  • Theoretical Analysis.

Technology Areas

  • Microelectronics