INCREASED ACCURACY CRYSTAL TEST SET
Abstract
The results of the development and design of an improved crystal test set covering the frequency range of 0.8 to 20 megacycles are presented. An analysis of the circuit, description of the delivered test sets, and typical test data are also included. The test set is of a Crystal Impedance M ETER Type and includes such features as power setability (0.01 to 1.0 milliwatts), improved accuracy (1 X 10 to the -6th power), and high repeatability (1 X 10 to the -8th power). Other features incorporated into the test set include decade re istance substitution, load capacitance insertion, a precision crystal oven with temperature control, frequency multiplication and an R. F. voltmeter. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1962
- Accession Number
- AD0291807
Entities
People
- R.f. Purnell
- S.b. Boor