PRODUCTION ENGINEERING MEASURE TYPE 2N1016B SILICON ALLOY TRANSISTOR

Abstract

A program aimed at improved reliability of high power silicon alloy transistors is described. Phases of the project inclu e redesign of some comp nents of the device, re inement or redesign of processes, and improved control of fabrication and internal device environments. Definite improvement of the hard-solder assembly i demonstrated. A supporting program of reliability measurement by means of high-temperature storage step-stress testing is outlined. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1962
Accession Number
AD0291832

Entities

People

  • S. Chinowsky
  • T. Csakvari

Organizations

  • Westinghouse Electric Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Alloys
  • Assembly
  • Engineering
  • Fabrication
  • High Temperature
  • Manufacturing
  • Production
  • Production Engineering
  • Reliability
  • Silicon
  • Silicon Alloys
  • Transistors

Readers

  • Semiconductor Device Technology
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  • Software Engineering