METHODS FOR PREDICTING COMBINED ELECTRONIC AND MECHANICAL SYSTEM RELIABILITY

Abstract

The major effort was devoted to investigating the area of mechanical reliability prediction. The feasibility of a number of approaches to the mechanical reliability prediction problem was considered. The extent to which an approach based at the mechanical failure mechanism level would be applicable to the program was investigated. A survey was made of information available in the area of mechanical failure mechanisms, including such items as fracture, instabilities, creep, fatigue, wear, corrosion, etc. It was concluded that a prediction technique based at such a level would not be the most effective for the purposes of the program because of the largely empirical and qualitative nature of the information available, and because there is no generally applicable theory connecting the existing information so as to provide a unified approach for the entire spectrum of mechanical failure mechanisms. The approach selected for mechanical reliability prediction is based at what is called the functional module level (an array of elements or components performing a specific function). This permits a more general approach to the problem while still allowing information to be used from lower system levels, such as failure mechanism information and any component reliability data which may be available.

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1962
Accession Number
AD0291919

Entities

People

  • Carlton E. Gebhart
  • Darwin F. Simonaitis
  • Thomas L. Bush

Organizations

  • IIT Research Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Creep
  • Electrical Engineering
  • Electron Tubes
  • Electronic Components
  • Engineering
  • Engineers
  • Failure Mode And Effect Analysis
  • Literature Surveys
  • Materials
  • Mechanical Components
  • Mechanical Engineering
  • Mechanical Working
  • Mechanics
  • Probability
  • Reliability
  • Test And Evaluation
  • Yield Strength

Fields of Study

  • Engineering

Readers

  • Metallurgy
  • Software Engineering
  • Theoretical Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems