DEVELOPMENT OF LOW NOISE- LOW DISTORTION TRANSISTOR

Abstract

Work was directed toward development, evaluation and characterization of the XP-734, a PNPsilicon large area device. The XP-734 exhibits noise figure at the high current level necessary for low distortion operation, which is very little increased over its low current value. Both noise figure and distortion measurements indicate the need for a higher frequency device to improve overall performance. Tests on recently developed higher frequency devices indicate that improvement in both noise figure and distortion is possible with further device and process refinement. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 15, 1962
Accession Number
AD0292346

Entities

People

  • Fred A. Rubi
  • John E. Muschinske

Organizations

  • Motorola Mobility

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Distortion
  • Frequency
  • Low Noise
  • Measurement
  • Noise
  • Test And Evaluation
  • Transistors

Readers

  • Electronics Engineering