NF RESISTOR FACTORIAL LOAD LIFE TEST
Abstract
Tests w re conducted to ob ain failure rate data and acceleration factor data on NF glass hermetically sealed tin-oxide resistors in sufficient detail to be meaningful to US Navy technical personnel and to industrial design engineers. The m jor por ion of the present effort was expended toward completion of activities leading up to installation of mounted and wired test boards in the ovens. The test circuit was altered to obtain faster comp nen delivery and to afford increased circuit reliability. Considerable effort was started in providing prop r proce i g procedures and in setting the resistor measurement equipment in good order. The 10, 00 hour test was started and approximately 500 hours of test time was accumulated on the resistors. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 03, 1963
- Accession Number
- AD0293145
Entities
People
- D.c. Thompson
Organizations
- Corning Inc.